AVS 53rd International Symposium | |
Applied Surface Science | Wednesday Sessions |
Session AS+BI-WeA |
Session: | Imaging and Characterization of Biological Materials |
Presenter: | D.W. Moon, Korea Research Institute of Standards and Science |
Authors: | D.W. Moon, Korea Research Institute of Standards and Science T.G. Lee, Korea Research Institute of Standards and Science E.S. Lee, Korea Research Institute of Standards and Science J.Y. Lee, Korea Research Institute of Standards and Science J.W. Shim, AmorePacific Corporation J.W. Kim, Seoul National University, Korea K.W. Kim, Seoul National University, Korea |
Correspondent: | Click to Email |