AVS 53rd International Symposium | |
Applied Surface Science | Wednesday Sessions |
Session AS+BI-WeA |
Session: | Imaging and Characterization of Biological Materials |
Presenter: | R.M.A. Heeren, FOM-Institute for Atomic and Molecular Physics, The Netherlands |
Authors: | R.M.A. Heeren, FOM-Institute for Atomic and Molecular Physics, The Netherlands E.R. Amstalden, FOM-Institute for Atomic and Molecular Physics, The Netherlands A.F.M. Altelaar, FOM-Institute for Atomic and Molecular Physics, The Netherlands M. Froesch, FOM-Institute for Atomic and Molecular Physics, The Netherlands L.A McDonnell, FOM-Institute for Atomic and Molecular Physics, The Netherlands |
Correspondent: | Click to Email |