AVS 52nd International Symposium | |
Applied Surface Science | Monday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
8:20am | AS+BI+NS-MoM1 Invited Paper The Development of NSOM for Live Cell Applications R.C. Dunn, O. Mooren, University of Kansas |
9:00am | AS+BI+NS-MoM3 Local Mobility in Membranes: Atomic Force Microscopy and Fluorescence Correlation Spectroscopy A.R. Burns, D.J. Frankel, Sandia National Laboratories |
9:20am | AS+BI+NS-MoM4 Molecular Orientation Imaging with sub 10-nm Resolution by Vector Piezoresponse Force Microscopy B.J. Rodriguez, North Carolina State University, S. Jesse, A.P. Baddorf, Oak Ridge National Laboratory, A. Gruverman, North Carolina State University, S.V. Kalinin, Oak Ridge National Laboratory |
9:40am | AS+BI+NS-MoM5 Invited Paper Nanoscale Raman and Fluorescence Microscopy of Carbon Nanotubes A. Hartschuh, H. Qian, A.J. Meixner, University of Tuebingen, Germany, N. Anderson, L. Novotny, University of Rochester |
10:20am | AS+BI+NS-MoM7 Scanning Atom Probe Study of Fragmentation of Organic Molecules O. Nishikawa, M. Taniguchi, Kanazawa Institute of Technology, Japan |
10:40am | AS+BI+NS-MoM8 Surface Potential Mapping of DNA-protein Complex at Molecular Level E. Mikamo, F. Yamada, T. Matsumoto, T. Kawai, Osaka University, Japan |
11:00am | AS+BI+NS-MoM9 Invited Paper The Importance of Aberration Corrected SEM and TEM to the Semiconductor Industry A.C. Diebold, SEMATECH & AMRC, B. Foran, ATDF & AMRC, M.J. Yacaman, B.A. Korgel, University of Texas & AMRC |
11:40am | AS+BI+NS-MoM11 Scanning Tunneling Microscope Assisted with Inner-Shell Excitation by Hard X-ray Micro-Beam A. Saito, Riken Harima Inst., Japan, J. Maruyama, K. Manabe, Osaka Univ., Japan, K. Kitamoto, Riken Harima Inst., Japan, K. Takahashi, Osaka Univ., Japan, Y. Tanaka, Riken Harima Inst., Japan, M. Yabashi, M. Ishii, Japan Synchrotron Radiation Res. Inst., M. Akai-Kasaya, Osaka Univ., Japan, S. Shin, T. Ishikawa, Riken Harima Inst., Japan, Y. Kuwahara, M. Aono, Osaka Univ., Japan |