AVS 52nd International Symposium | |
Nanometer-Scale Science and Technology | Tuesday Sessions |
Session NS+EM-TuM |
Session: | Nanoscale Electronic Devices & Detection |
Presenter: | S.M. Luber, Walter Schottky Institut, TU Muenchen, Germany |
Authors: | S.M. Luber, Walter Schottky Institut, TU Muenchen, Germany F. Zhang, Walter Schottky Institut, TU Muenchen, Germany S. Strobel, Walter Schottky Institut, TU Muenchen, Germany A. Hansen, Walter Schottky Institut, TU Muenchen, Germany D. Schuh, Universitaet Regensburg, Germany M. Bichler, Walter Schottky Institut, TU Muenchen, Germany M. Tornow, Walter Schottky Institut, TU Muenchen, Germany |
Correspondent: | Click to Email |