AVS 52nd International Symposium
    Electronic Materials and Processing Thursday Sessions
       Session EM1-ThM

Paper EM1-ThM6
Chemically Resolved Electrical Measurements within Monomolecular Layers

Thursday, November 3, 2005, 10:00 am, Room 309

Session: Molecular Electronics
Presenter: H. Cohen, Weizmann, Israel
Authors: H. Cohen, Weizmann, Israel
R. Yerushalmi, Weizmann, Israel
N. Granit, Weizmann, Israel
A. Shukla, Weizmann, Israel
M.E. van der Boom, Weizmann, Israel
A. Scherz, Weizmann, Israel
Correspondent: Click to Email
Interesting electrical characteristics within monomolecular layers are revealed by chemically resolved electrical measurements (CREM).@footnote 1,2@ The method is based on slightly modified X-ray photoelectron spectroscopy (XPS), using energy-filtered electrons as fine and flexible electrodes. Our recent results manifest breakthrough capabilities for future molecular electronics applications. @FootnoteText@ @footnote 1@ H.Cohen, Applied Physics Letters 85, 1271 (2004).@footnote 2@ H. Cohen, C. Nogues, I. Zon and I. Lubomirsky, J. Appl. Phys., in press.