AVS 51st International Symposium | |
Thin Films | Friday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
8:20am | TF-FrM1 Real-time and Spectroscopic Second Harmonic Generation as a Tool to Probe Surface Processes during Amorphous Silicon Film Growth I.M.P. Aarts, J.J.H. Gielis, C.M. Leewis, M.C.M. van de Sanden, W.M.M. Kessels, Eindhoven University of Technology, The Netherlands |
8:40am | TF-FrM2 Invited Paper MultiChannel Mueller Matrix Ellipsometry for In-Situ and Real Time Analysis of Thin Films and Surfaces R.W. Collins, C. Chen, I. An, N.J. Podraza, University of Toledo |
9:20am | TF-FrM4 Analysis of Ti and TiN Thin Film Nucleation, Coalescence, and Growth by Rotating Compensator Multichannel Ellipsometry C. Chen, The Penn State University, B. Hong, Sungkyunkwan University, Korea, P. Sunal, M.W. Horn, R. Messier, The Penn State University, R.W. Collins, University of Toledo |
9:40am | TF-FrM5 Comparative Ellipsometric Study of Liquid Helium Thin Films on Au, Cs, HOPG and Rb Substrates T. McMillan, P. Taborek, J.E. Rutledge, University California Irvine |
10:00am | TF-FrM6 Invited Paper Studies of Coupling and Ordering in Magnetic Thin Films with Polarized Neutron Reflectormetry S.G.E. te Velthuis, Argonne National Laboratory |
10:40am | TF-FrM8 Real-time Optical Monitoring of Ammonia Decomposition Kinetics in InN Vapor Phase Epitaxy at Elevated Pressures N. Dietz, M. Strassburg, V. Woods, Georgia State University |
11:00am | TF-FrM9 In-Situ Real-Time FT-IR Spectroscopy During APCVD: The Effect of B and P Dopants on SiO@sub 2@ Deposition A. Effenberger, L.D. Flores, J.E. Crowell, University of California, San Diego |
11:20am | TF-FrM10 Optimal Control on Composition and Optical Properties of Silicon Oxynitride Thin Films E.C. Samano, J. Camacho, R. Machorro, CCMC-UNAM, Mexico |
11:40am | TF-FrM11 III Nitride-Based Optical Sensors Integrated with a TOF Mass Spectrometer for Aerosol Characterization. D. Starikov, N. Medelci, R. Pillai, Integrated Micro Sensors Inc., A. Bensaoula, C. Joseph, Z. Mouffak, University of Houston |