| AVS 51st International Symposium | |
| Organic Films and Devices | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:20am | OF+NS-ThM1 Molecular Engineering to Test the Mechanism of Conductance Switching for a Variety of Conjugated Molecules A.M. Moore, B.A. Mantooth, A.A. Dameron, Z.J. Donhauser, The Pennsylvania State University, J.W. Ciszek, F. Maya, Y. Yao, J.M. Tour, Rice University, P.S. Weiss, The Pennsylvania State University |
| 8:40am | OF+NS-ThM2 Room Temperature Molecular Memory Observed from a Nanowell Device N. Gergel, N. Majumdar, University of Virginia, K. Keyvanfar, N. Swami, University of Virgina, L.R. Harriott, J.C. Bean, University of Virginia |
| 9:00am | OF+NS-ThM3 Invited Paper Metal/Molecule/Metal and Metal/Molecule/Semiconductor Device Structures D. Janes, Purdue University |
| 9:40am | OF+NS-ThM5 Room Temperature Negative Differential Resistance Measured through Molecular Monolayers Adsorbed to Silicon Surfaces with Ultra-high Vacuum Scanning Tunneling Microscopy N.P. Guisinger, R. Basu, M.E. Greene, A.S. Baluch, M.C. Hersam, Northwestern University |
| 10:00am | OF+NS-ThM6 Two Distinct Types of Switching Behavior in a Single Molecule A.S. Blum, J.G. Kushmerick, C.H. Patterson, Naval Research Laboratory, J.C. Yang, Duke University, J.C. Henderson, Y. Yao, J.M. Tour, Rice University, R. Shashidhar, Geo-Centers, Inc., B.R. Ratna, Naval Research Laboratory |
| 10:20am | OF+NS-ThM7 Electrical and Mechanical Contacts at the Atomic Scale: a Combined UHV STM/AFM Study Y. Sun, M. Henrik, S. Schaer, Y. Miyahara, A.-S. Lucier, M.E. Ouali, P. Grutter, McGill University, Canada, W. Hofer, University of Liverpool, United Kingdom |
| 10:40am | OF+NS-ThM8 Structure of Self-Assembled Monolayers on Platinum D.Y. Petrovykh, University of Maryland, Naval Research Laboratory, H. Kimura-Suda, A. Opdahl, L.J. Richter, R.D. Van Zee, M.J. Tarlov, National Institute of Standards and Technology, L.J. Whitman, Naval Research Laboratory |
| 11:00am | OF+NS-ThM9 Oligomer Length Dependent Study of Metal-Molecule Interactions in Model Molecular Wire Systems C.D. Zangmeister, S.W. Robey, R.D. Van Zee, NIST |
| 11:40am | OF+NS-ThM11 Electrical Properties of DNA Characterized by Conducting-Atomic Force Microscopy C. Nogues, S.R. Cohen, S. Daube, R. Naaman, Weizmann Institute of Science, Israel |