| AVS 51st International Symposium | |
| Nanometer-scale Science and Technology | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:00pm | NS1-ThA1 Single Electron Charging in Individual InAs Quantum Dot Observed by Nonconctact Atomic Force Microscopy Y. Miyahara, R. Stomp, S. Schaer, Q. Sun, H. Guo, McGill University, Canada, S. Studenikin, P. Poole, A. Sachrajda, National Research Council, Canada, P. Grutter, McGill University, Canada |
| 2:20pm | NS1-ThA2 Nanoelectromechanics of Scanning Probe Microscopies of Ferroelectric Surfaces S.V. Kalinin, Oak Ridge National Laboratory, A. Gruverman, North Carolina State University, J. Shin, A.P. Baddorf, Oak Ridge National Laboratory, E. Karapetian, M. Kachanov, Tufts University |
| 2:40pm | NS1-ThA3 Invited Paper High-Resolution Force Microscopy: Observing Atoms at Work R. Bennewitz, McGill University, Canada, L. Nony, E. Gnecco, O. Pfeiffer, A. Socoliuc, S. Maier, A. Wetzel, C. Gerber, E. Meyer, A. Baratoff, University of Basel, Switzerland |
| 3:20pm | NS1-ThA5 Imaging of Radiation Effects on an Active Silicon-On-Insulator (SOI) Device using Scanning Capacitance Microscopy (SCM) C.Y. Nakakura, M.R. Shaneyfelt, R.A. Jones, Sandia National Laboratories |
| 3:40pm | NS1-ThA6 High Resolution Structural and Chemical Information: A Combined STM, SEM and SAM Analysis of Ag Nanocrystallites on Si J. Westermann, M. Maier, J. Poppensieker, G. Schaefer, OMICRON NanoTechnology GmbH, Germany |
| 4:00pm | NS1-ThA7 Atomic Level Analysis of Polythiophene by the Scanning Atom Probe O. Nishikawa, M. Taniguchi, M. Ihara, Kanazawa Institute of Technology, Japan, H. Kato, S. Takemura, Kanto Gakuin University, Japan |
| 4:20pm | NS1-ThA8 Probing Ion Transport at the Nanoscale: Time-Domain Electrostatic Force Spectroscopy on Glassy Electrolytes A. Schirmeisen, A. Taskiran, H. Fuchs, B. Roling, S. Murugavel, H. Bracht, F. Natrup, University of Muenster, Germany |
| 5:00pm | NS1-ThA10 Novel MEMS Devices for Accurate Lateral and Normal Force Measurement in AFM P.J. Cumpson, National Physical Laboratory, UK, J. Hedley, Newcastle University, UK |