| AVS 51st International Symposium | |
| Nanometer-scale Science and Technology | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:20am | NS-TuM1 Controlled Fabrication and Modification of Organized Carbon Nanotube Architectures Y.J. Jung, R. Vajtai, N. Chakrapani, G. Meng, P.M. Ajayan, Rensselaer Polytechnic Institute, Y. Homma, Y. Kobayashi, NTT Basic Research Laboratories, T. Ogino, Yokohama National University, Japan |
| 8:40am | NS-TuM2 Growth of Arrays of mm Long, Straight Single-Walled Carbon Nanotubes Z. Yu, S. Li, P. Burke, UC Irvine |
| 9:00am | NS-TuM3 Low-temperature Synthesis of Aligned Carbon Nanotubes by Hot-Filament Assisted DC Plasma CVD Y. Watanabe, Y. Hayashi, S. Nishino, Kyoto Institute of Technology, Japan |
| 9:20am | NS-TuM4 Theoretical Study of Catalytic Growth Single-Walled Carbon Nanotubes F. Ding, K. Bolton, A. Rosen, Goteborg University and Chalmers, Sweden |
| 9:40am | NS-TuM5 Invited Paper Controlling and Modeling the Interphase in Polymeric Nanocomposites L.C. Brinson, H. Liu, T. Ramanathan, Northwestern University |
| 10:20am | NS-TuM7 Wetting of Individual Carbon Nanotubes with Organic Liquids A.H. Barber, S.R. Cohen, H.D. Wagner, Weizmann Institute of Science, Israel |
| 10:40am | NS-TuM8 Impregnation of Osmium Dioxide to MWCNTs and Improvement of the Electron Emission Characteristics T. Noguchi, M. Shimamoto, M. Nishiwaki, KEK, Japan, K. Tatenuma, KAKEN Inc., Japan, S. Kato, KEK, Japan |
| 11:00am | NS-TuM9 Electron Emission Property from MWCNTs with Subnano Ruthenium Dioxide Clusters and with High Adhesivity on Substrate - High Current Endurance Test in UHV and Influence of H@sub 2@O or CO - M. Shimamoto, T. Noguchi, M. Nishiwaki, KEK, Japan, K. Tatenuma, KAKEN Inc., Japan, S. Kato, KEK, Japan |
| 11:20am | NS-TuM10 Synthesis of Y-Junction Singlewall Carbon Nanotubes Y.C. Choi, W. Choi, Florida International University |
| 11:40am | NS-TuM11 Surface-Programmed Assembly Process of Large-Size Multi-Wall Carbon Nanotubes and Its Mechanism J. Im, M. Lee, S. Hong, Seoul National University, South Korea |