| AVS 51st International Symposium | |
| Applied Surface Science | Monday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:20am | AS-MoM1 Application of TOF-SIMS to Environmentally Relevant Surface and Interfaces D.J. Gaspar, A. Laskin, Pacific Northwest National Laboratory, B.J. Finlayson-Pitts, University of California, Irvine, B.M. Sass, Battelle Memorial Institute |
| 8:40am | AS-MoM2 Invited Paper Cluster Primary Ion Beam Secondary Ion Mass Spectrometry for 2 and 3 Dimensional SIMS Analysis G. Gillen, P. Chi, A.J. Fahey, C.M. Mahoney, M.S. Wagner, National Institute of Standards and Technology |
| 9:20am | AS-MoM4 Fundamentals and Applications of a New Bi-cluster Liquid Metal Ion Source F. Kollmer, P. Hoerster, R. Moellers, D. Rading, T. Grehl, E. Niehuis, ION-TOF GmbH, Germany |
| 9:40am | AS-MoM5 TOF-SIMS Studies using a Newly Developed C@sub 60@@super +@ Primary Ion Gun: Fundamental Aspects and Applications R. Moellers, F. Kollmer, D. Rading, T. Grehl, E. Niehuis, ION-TOF GmbH, Germany |
| 10:00am | AS-MoM6 ToF-SIMS Quantitation of PDMS at the Surface of a Dehydrated Commercial Hydrogel Material J.A. Gardella, Jr., State University of New York at Buffalo |
| 10:20am | AS-MoM7 SIMS Trace Uranium Measurements in HfO Films with the ims-1270 A.J. Fahey, National Institute of Standards and Technology |
| 10:40am | AS-MoM8 Improved Analysis of Bulk Insulators using Magnetic Sector SIMS with O@sub 2@@super +@ Primary Beam and Electron Beam Adjacent to Analysis Area F.A. Stevie, C. Gu, A. Pivovarov, R. Garcia, D.P. Griffis, North Carolina State University |
| 11:00am | AS-MoM9 Ionization of Al Atoms Emitted from Al Metal X. Chen, University of California, Riverside, Z. Sroubek, Czech Academy of Sciences, Czech Republic, J. Yarmoff, University of California, Riverside |