| AVS 51st International Symposium | |
| Applied Surface Science | Monday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:00pm | AS-MoA1 Single Photon Ionization of a Derivatized Peptide Covalently Bound to a Surface P.D. Edirisinghe, S.S. Lateef, C.A. Crot, L. Hanley, University of Illinois at Chicago, J.F. Moore, W.F. Calaway, M.J. Pellin, Argonne National Laboratory |
| 2:20pm | AS-MoA2 ToF-SIMS Applications in the Analysis of DNA Microarrays K.K. Soni, Corning Incorporated |
| 2:40pm | AS-MoA3 Invited Paper Cell Imaging, DNA Diagnostics, Protein Analysis: Mass Spectrometric Characterization of Biological Surfaces H.F. Arlinghaus, Physikalisches Institut der Universität Münster, Germany |
| 3:20pm | AS-MoA5 Molecular Depth Profiling of Polymer Multilayers using a Polyatomic Primary Ion Beam M.S. Wagner, National Institute of Standards and Technology |
| 3:40pm | AS-MoA6 Applications of Cluster SIMS for Molecular Depth Profiling in Biomaterial Systems C.M. Mahoney, National Institute of Standards and Technology, J.-X. Yu, J.A. Gardella, Jr., State University of New York at Buffalo, A.M. Johnson, R. Langer, Massachusetts Institute of Technology |
| 4:00pm | AS-MoA7 Improved ToF-SIMS Ion Yields and Cationization of Water-Soluble Analytes by Polyelectrolyte Multilayers Y.-Y. Lua, C.A. Pew, Brigham Young University, A. Schnieders, ION-TOF USA, Inc., P.B. Savage, R.C. Davis, M.R. Linford, Brigham Young University |
| 4:20pm | AS-MoA8 Three-Dimensional Reconstruction of Elemental Distributions from TOF-SIMS Image Depth Profiles S.R. Bryan, D.G. Watson, Physical Electronics USA |