AVS 51st International Symposium
    Surface Science Monday Sessions
       Session SS-MoP

Paper SS-MoP18
Effect of Nitrogen Addition on the Liquid Crystal Alignment from Hydrogenated Amorphous Carbon

Monday, November 15, 2004, 5:00 pm, Room Exhibit Hall B

Session: Poster Session
Presenter: H.J. Ahn, Yonsei University, Korea
Authors: H.J. Ahn, Yonsei University, Korea
K.C. Kim, Yonsei University, Korea
J.B. Kim, Yonsei University, Korea
H.K. Baik, Yonsei University, Korea
C.J. Park, Yonsei University, Korea
J.Y. Hwang, Yonsei University, Korea
H.K. Kang, Yonsei University, Korea
D.S. Seo, Yonsei University, Korea
Correspondent: Click to Email
In order to control the alignment of nematic liquid crystal (LC), nitrogen addition to the hydrogenated amorphous carbon thin films was investigated. The hydrogenated amorphous carbon layer had been developed the novel inorganic alignment layer for ion beam (IB) irradiation method. The IB method preserved some damage of the alignment layer since it was the non-contact alignment type. However, the low pretilt angle and the weak anchoring force were pointed out the vulnerable points. The alignment layer was deposited by plasma enhanced chemical vapor deposition (PECVD), and the nitrogen addition to the amorphous carbon layer could cause the change of pretilt angle. XPS and the contact angle were measured for analysis of the alignment layer and polarized optical microscope (POM) and pretilt angle measurement instrument were used to estimate the LC cells.