AVS 50th International Symposium
    QSA-10 Topical Conference Monday Sessions

Session QS-MoM
Advances in Quantitative Surface Analysis

Monday, November 3, 2003, 8:20 am, Room 320
Moderator: C.J. Powell, National Institute of Standards and Technology


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Click a paper to see the details. Presenters are shown in bold type.

8:20am QS-MoM1 Invited Paper
Modules for an XPS Expert System: Applications in Corrosion Science
J.E. Castle, University of Surrey, UK
9:20am QS-MoM4 Invited Paper
Auger Electron Spectroscopy: Reducing Measurement Uncertainty
J.D. Geller, Geller MicroAnalytical Laboratory
10:20am QS-MoM7 Invited Paper
Molecular Characterization of Biomaterials with ToF-SIMS Imaging
N. Winograd, Penn State University
11:20am QS-MoM10
Extrinsic and Intrinsic Excitations in Ge and Si Photoelectron Spectra
L. Kövér, Z. Berényi, Institute of Nuclear Research of the Hungarian Academy of Sciences, S. Tougaard, University of Southern Denmark, F. Yubero, Institutio de Ciencia de Materiales de Sevilla, Spain, I. Cserny, J. Végh, J. Tóth, D. Varga, Institute of Nuclear Research of the Hungarian Academy of Sciences, W. Drube, T. Eickhoff, HASYLAB at Deutsches Elektronen-Synchrotron DESY, Germany
11:40am QS-MoM11
Multivariate Analysis for XPS Spectral Imaging@footnote 1@
D.E. Peebles, J.A. Ohlhausen, P.G. Kotula, Sandia National Laboratories