AVS 50th International Symposium | |
Thin Films | Wednesday Sessions |
Session TF+MM-WeA |
Session: | Sensors, Smart Films and Functional Materials |
Presenter: | J.N. Ullom, National Institute of Standards and Technology |
Authors: | J.N. Ullom, National Institute of Standards and Technology J.A. Beall, National Institute of Standards and Technology J. Beyer, PTB, Guest Researcher NIST S. Deiker, National Institute of Standards and Technology W.B. Doriese, National Institute of Standards and Technology G.C. Hilton, National Institute of Standards and Technology K.D. Irwin, National Institute of Standards and Technology C.D. Reintsema, National Institute of Standards and Technology L.R. Vale, National Institute of Standards and Technology |
Correspondent: | Click to Email |