AVS 50th International Symposium
    Surface Science Wednesday Sessions
       Session SS-WeP

Paper SS-WeP6
Chemical Structure of the Pt/CdZnTe Interface*

Wednesday, November 5, 2003, 11:00 am, Room Hall A-C

Session: Poster Session
Presenter: D.J. Gaspar, Pacific Northwest National Laboratory
Authors: D.J. Gaspar, Pacific Northwest National Laboratory
M.H. Engelhard, Pacific Northwest National Laboratory
D.E. McCready, Pacific Northwest National Laboratory
A.A. Rouse, eV PRODUCTS
Cs. Szeles, eV PRODUCTS
Correspondent: Click to Email
We have determined the interfacial electronic and chemical structure for the Pt/CdZnTe system using scanning electron microscopy/energy dispersive x-ray spectroscopy (SEM/EDX), X-ray diffraction (XRD) and x-ray photolectron spectroscopy (XPS). XRD was performed on aggressively aged controls (such as Pt/Te, where PtTe@sub 2@ was formed) to elucidate the phases expected to form under normal annealing conditions. The presence of the phases was confirmed by looking at the specimens in cross-section with SEM/EDX. This was followed by XPS depth profiling experiments to determine binding energy shifts associated with the various phases, which were then used to determine the phases present in the more narrow interfacial regions of typical Pt/CZT structures for a variety of annealing conditions and for varying compositions.@FootnoteText@*This work supported by the DOE NNSA NA-22 program