AVS 50th International Symposium
    Nanometer Structures Tuesday Sessions
       Session NS-TuM

Paper NS-TuM8
Defect Mediated Electronic Transport in Nano and Molecular Wires

Tuesday, November 4, 2003, 10:40 am, Room 308

Session: Nanowires
Presenter: D.A. Bonnell, University of Pennsylvania
Authors: D.A. Bonnell, University of Pennsylvania
S. Kalinin, University of Pennsylvania
M. Freitag, University of Pennsylvania
A.T. Johnson, University of Pennsylvania
Correspondent: Click to Email
Any rational approach to nanostructure design necessitates a fundamental understanding of the properties of the constituents, as well as collective behavior of ensembles. We have developed 2 new approaches to measuring local electromagnetic properties based on scanning probes that can be applied to nano and molecular wires, Scanning Impedance Microscopy and Nano Impedance Spectroscopy. These approaches access the frequency dependence of electronic transport over 3-6 orders of magnitude, depending on experimental conditions. The frequency dependence can be used to determine mechanisms of electronic transport, particularly the processes that occur at defects. We demonstrate this approach by determining the local electronic structures of individual defects in single walled carbon nanotubes. We then generalize to nanowires and molecular wires.