AVS 50th International Symposium
    Nanometer Structures Tuesday Sessions
       Session NS-TuM

Paper NS-TuM4
Onset of Nanowire Growth by Vapor-Liquid-Solid (VLS) Epitaxy

Tuesday, November 4, 2003, 9:20 am, Room 308

Session: Nanowires
Presenter: J.W. Dailey, Arizona State University
Authors: J.W. Dailey, Arizona State University
J.L. Taraci, Arizona State University
T. Michael, Arizona State University
J.C. Thorp, Arizona State University
S.T. Picraux, Arizona State University
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We report on CVD growth of Ge and Si nanowires on Si substrates by the Vapor Liquid Solid (VLS) technique. While many groups have formed random clusters of Si nanowires at high pressures by VLS, relatively little effort has been directed at the controlled CVD growth of epitaxial arrays of nanopillars or nanowires directly onto Si substrates. In our studies Au nanodots are formed by UHV evaporation on hydrogen terminated Si (100) and (111) substrates. Subsequent selective area growth is carried out using digermane or disilane at pressures from 1 x 10-2 to 1 x 10-5 T and temperatures from 400 to 600 C. At the lower pressures (representative of gas phase MBE) we observe the growth of Ge nanopillars that nucleate at the AuSi eutectic and grow vertically and laterally, undergoing coalescence as growth continues. RBS and ion channeling are used to establish the VLS substrate orientation and temperature dependent kinetics of the Ge nanopillar growth, and SEM elucidates the morphological evolution of the nanopillars. At pressures above 10-4 T we observe an abrupt change in the nature of the growth from a relatively slow nanopillar growth to a much more rapid nanowire growth. The nanowires are distinguished by long narrow axial growth structures with much slower lateral growth. The transition from nanopillar to nanowire growth is interpreted in terms of a nucleation-limited process. Due to the small lateral dimensions (10 to 50 nm) of these 3-D structures lateral strain relief is expected to occur and large lattice mismatches should be accommodated without defects, in contrast to large area heteroepitaxy. These CVD nanoscale structures could form the basis for new in situ synthesis of 3-D Si device structures on Si substrates.