AVS 50th International Symposium | |
Applied Surface Science | Tuesday Sessions |
Session AS-TuM |
Session: | Image Analysis and Polymer Characterization |
Presenter: | L. Chen, State University of New York at Buffalo |
Authors: | L. Chen, State University of New York at Buffalo A.P. van Bavel, Eindhoven University of Technology, The Netherlands J.A. Gardella, State University of New York at Buffalo |
Correspondent: | Click to Email |