| AVS 50th International Symposium | |
| Applied Surface Science | Tuesday Sessions |
| Session AS-TuM |
| Session: | Image Analysis and Polymer Characterization |
| Presenter: | L. Chen, State University of New York at Buffalo |
| Authors: | L. Chen, State University of New York at Buffalo A.P. van Bavel, Eindhoven University of Technology, The Netherlands J.A. Gardella, State University of New York at Buffalo |
| Correspondent: | Click to Email |