AVS 50th International Symposium
    Applied Surface Science Tuesday Sessions
       Session AS-TuM

Paper AS-TuM8
Grazing Incident X-ray Diffraction Study of Poly(alkylthiophene) Thin Films on Various Substrates

Tuesday, November 4, 2003, 10:40 am, Room 324/325

Session: Image Analysis and Polymer Characterization
Presenter: A. Takahara, Kyushu University, Japan
Authors: M. Morita, Kyushu University, Japan
T. Koga, Kyushu University, Japan
H. Yakabe, Kyushu University, Japan
S. Sasaki, Kyushu University, Japan
O. Sakata, JASRI, Japan
A. Takahara, Kyushu University, Japan
Correspondent: Click to Email
The crystalline aggregation states of organic semiconductor molecules in thin films might play an important role in the performance of organic semiconductors. The purpose of this study is to reveal the crystalline orientation and crystallinity of spin-coated poly(3-hexylthiophene)[P3HT] on Si-wafer substrate at the near　surface region and internal phase. The surface crystalline states of P3HT thin film were studied with synchrotron radiation in-plane grazing incidence x-ray diffraction GIXD. Surface modification of Si-wafer with perfluorohexylethyltrimethoxysilane prior to P3HT coating resulted in the preferential orientation with the alkyl side chains normal to the substrate surface. In contrast, the surface modification of Si-wafer with vacuum ultraviolet(VUV)-ray with wave length of 172nm or n-octadecyltrimethoxysilane resulted in the orientation with the alkyl side chains parallel to the substrate.