AVS 50th International Symposium
    Applied Surface Science Tuesday Sessions
       Session AS-TuM

Paper AS-TuM7
Time-of-Flight Secondary Ion Mass Spectrometry of Ordered Polymeric Monolayers: Effect on Tertiary Structures

Tuesday, November 4, 2003, 10:20 am, Room 324/325

Session: Image Analysis and Polymer Characterization
Presenter: R. Rey-Santos, State University of New York at Buffalo
Authors: J.A. Gardella, Jr., State University of New York at Buffalo
R. Rey-Santos, State University of New York at Buffalo
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The study of polymer surface structures has become an important topic in surface chemistry. Poly(dimethylsiloxane) (PDMS) plays very important roles in biological and pharmaceutical applications. A similar study of poly(methylmethacrylate) published by Nowak et al in Analytical Chemistry in 2000 was used as a model. Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) is one of the most powerful techniques for polymer study. TOF-SIMS was used to study the fragmentation mechanism of this polymer. Using a statistical chain breaking model of PDMS helped us to understand the fragmentation pattern obtained in the spectra. The Langmuir-Blodgett (LB) technique helps us to prepare a molecular monolayer at the air/water interface. The LB technique was used to prepare well-ordered monolayers. Reflection Absorption Fourier Transform Infrared Spectrophotometry (RA-FTIR) is an ideal technique for surface study to obtain information about molecular structures. It has been used to compare results from amorphous, solution cast films to that from ordered, LB films of PDMS. An ion formation mechanism for PDMS was investigated to get information of the long-range forces between polymer chains.