AVS 50th International Symposium
    Applied Surface Science Tuesday Sessions
       Session AS-TuM

Paper AS-TuM4
XPS and Confocal Microscopy Data Fusion for Polymer Characterization

Tuesday, November 4, 2003, 9:20 am, Room 324/325

Session: Image Analysis and Polymer Characterization
Presenter: K. Artyushkova, The University of New Mexico
Authors: K. Artyushkova, The University of New Mexico
J.E. Fulghum, The University of New Mexico
J. Fenton, The University of New Mexico
J. Farrar, The University of New Mexico
J. Khan, Kent State University
F. Xu, Kent State University
N. Bantan, Kent State University
Correspondent: Click to Email
Advances in materials development require a three-dimensional characterization of complex polymeric samples in terms of both chemical structure and morphology over feature sizes ranging from nanometers to millimeters. Correlating information from multiple techniques is one method for the development of a comprehensive 'picture' of the material under study. New opportunities for multi-technique correlations arise from the improved spatial resolution and decreased acquisition times now available in a variety of imaging methods. Imaging XPS and confocal microscopy (CM) are complementary techniques that, in combination, allow for the visualization of the internal structure of heterogeneous polymer samples. Quantitative chemical information that is readily available from the surface sensitive XPS images and spectra will be used to extract quantitative data from confocal images, which are acquired from different depth levels throughout the sample. The XPS and CM data sets can then be 'fused' to provide a surface-to-bulk visualization of changes in polymer chemistry. This work has been partially supported by NSF CHE-0113724 and NSF IGERT CORE program.