AVS 50th International Symposium
    Applied Surface Science Tuesday Sessions
       Session AS-TuM

Paper AS-TuM3
Correlation of XPS and AFM Images for Polymer Blends

Tuesday, November 4, 2003, 9:00 am, Room 324/325

Session: Image Analysis and Polymer Characterization
Presenter: J. Farrar, University of New Mexico
Authors: J. Farrar, University of New Mexico
K. Artyushkova, University of New Mexico
J.E. Fulghum, University of New Mexico
F. Xu, Kent State University
N. Bantan, Kent State University
J. Khan, Kent State University
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Multi-technique analysis of heterogeneous polymer samples, based on AFM and XPS imaging, will provide a more complete picture of the sample under study than either technique alone. AFM provides both topographical and phase contrast information on the nanometer scale, but no chemical information is provided. Imaging XPS provides elemental and chemical information on the micron scale. A method to chemically identify the observed phases in AFM through correlation with quantitative XPS imaging will be discussed. Correlating the data from both techniques involves resizing, image alignment, resolution matching, and classification methods. The approach will be applied to a patterned polymer surface of known properties for validation and then to heterogeneous polymer blends of polystyrene/polybutadiene for phase identification. This project represents one aspect of the Active Knowledge Mesh Model (AKM) that is currently under development in our laboratories. AKM is a comprehensive image analysis system that integrates data from different techniques into a realistic three-dimensional model, visualizing structure and morphology, in multicomponent heterogeneous samples. This work has been partially supported by NSF ALCOM (DMR89-20147), NSF CHE-0113724, NSF IGERT CORE and UNM.