AVS 50th International Symposium | |
Applied Surface Science | Tuesday Sessions |
Session AS-TuM |
Session: | Image Analysis and Polymer Characterization |
Presenter: | F. Assi, ETH Zurich, Switzerland |
Authors: | F. Assi, ETH Zurich, Switzerland S. Pasche, ETH Zurich, Switzerland L. Feuz, ETH Zurich, Switzerland N.D. Spencer, ETH Zurich, Switzerland M. Textor, ETH Zurich, Switzerland |
Correspondent: | Click to Email |