| AVS 50th International Symposium | |
| Applied Surface Science | Tuesday Sessions |
| Session AS-TuM |
| Session: | Image Analysis and Polymer Characterization |
| Presenter: | F. Assi, ETH Zurich, Switzerland |
| Authors: | F. Assi, ETH Zurich, Switzerland S. Pasche, ETH Zurich, Switzerland L. Feuz, ETH Zurich, Switzerland N.D. Spencer, ETH Zurich, Switzerland M. Textor, ETH Zurich, Switzerland |
| Correspondent: | Click to Email |