AVS 50th International Symposium
    Applied Surface Science Thursday Sessions
       Session AS-ThA

Invited Paper AS-ThA7
Insights into the Physical and Electronic Structure of Surfaces from Reflection Anisotropy Spectroscopy

Thursday, November 6, 2003, 4:00 pm, Room 324/325

Session: Electron and Photon Spectroscopies
Presenter: P. Weightman, University of Liverpool, UK
Correspondent: Click to Email

Reflection Anisotropy Spectroscopy (RAS) is a non destructive surface sensitive optical probe capable of operation within a wide range of environments. RAS achieves surface sensitivity by measuring the change in polarisation on reflection of normal incidence light from the surface of a cubic crystal. The technique has been shown to be a sensitive probe of molecular orientation on surfaces@footnote 1,2@ which is capable of monitoring growth at metal/liquid interfaces.@footnote 3,4@ Recent improvements in instrumentation@footnote 4@ have greatly increased the speed of response of RAS equipment so that it can be used to monitor growth at realistic growth rates and to provide information on the orientation and interaction between biological molecules at metal/liquid interfaces on a fast time scale. This talk will present recent results of studies of the physical and electronic structure of metal and semiconductor surfaces and of the RAS of DNA bases and DNA sequences adsorbed at the Au(110)/electrolyte interface. A brief description will be given of how the sensitivity, spectral range and in particular the timescale of RAS will be radically improved by the proposed UK Fourth Generation Light Source (4GLS). @FootnoteText@@footnote 1@J.R. Power, P. Weightman, S. Bose, A.I. Shkrebtii and R. Del Sole, Phys. Rev. Lett. 80 3133-6 (1998).@footnote 2@B.G. Frederick, J.R. Power, R.J. Cole, C.C. Perry, Q. Chen, S.Haq, Th. Bertrams, N.V. Richardson and P. Weightman. Phys. Rev. Lett. 80 4490-3 (1998).@footnote 3@B. Sheriden, D.S. Martin, J.R. Power, S.D. Barrett, C.I. Smith, C.A. Lucas, R.J. Nichols and P. Weightman, Phys. Rev. Lett. 85 4618-21 (2000).@footnote 4@P. Harrison, T. Farrell, A. Maunder, C.I. Smith and P. Weightman, Meas. Sci. Technol. 12 2185-91 (2001).