| AVS 49th International Symposium | |
| Nanotubes: Science and Applications Topical Conference | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:20am | NT-TuM1 Room Temperature Coulomb Diamond Characteristics in Single Electron Transistor with Position Controlled Grown Carbon Nanotube Channel K. Matsumoto, National Institute of Advanced Industrial Science & Technology, Japan, T. Kamimura, Tsukuba University, Japan, M. Maeda, K. Sakamoto, K. Kurachi, Meiji University, Japan |
| 8:40am | NT-TuM2 Current Measurement with Tapping Mode AFM to Determine the Electrical Properties of Carbon Nanotubes M. Stadermann, J.J. Boland, M.R. Falvo, R. Superfine, S. Washburn, University of North Carolina at Chapel Hill |
| 9:00am | NT-TuM3 Modeling of Gate Bias Modulation in Carbon Nanotube Field-Effect Transistors T. Yamada, NASA Ames Research Center |
| 9:20am | NT-TuM4 Charge Imaging and Manipulation Using Carbon Nanotube Probes S.-D. Tzeng, C.-L. Wu, Y.-C. You, T.T. Chen, S. Gwo, National Tsing-Hua University, Taiwan, ROC, H. Tokumoto, AIST, Japan |
| 9:40am | NT-TuM5 Band Gap Engineering in Carbon Nanotubes J. Lee, Seoul National University, H. Kim, J. Ihm, Seoul National University, Korea, S.-J. Kahng, Soongsil University, Korea, H. Shinohara, Nagoya University, Japan, Y. Kuk, Seoul National University, Korea |
| 10:00am | NT-TuM6 Modifying and Probing the Electrical Properties of Carbon Nanotube Devices using an Atomic Force Microscope J.-Y. Park, Y. Yaish, S. Rosenblatt, M. Brink, P.L. McEuen, Cornell University |
| 10:20am | NT-TuM7 Electrostatically Focused Microfabricated Field Emission Electron Sources with Single Vertically Aligned Carbon Nanofiber Cathodes M.A. Guillorn, Oak Ridge National Lab, A.V. Melechko, M.D. Hale, Univ. of Tennessee, Knoxville, R.J. Kasica, V.I. Merkulov, Oak Ridge National Lab, E.D. Ellis, Univ. of Tennessee, Knoxville, D.K. Hensley, M.L. Simpson, L.R. Baylor, J.H. Whealton, D.H. Lowndes, Oak Ridge National Lab |
| 10:40am | NT-TuM8 Fabrication and Electrical Characterization of Multiwalled Carbon Nanotube Field Emission Devices with Integrated Focusing Electrodes M.D. Hale, University of Tennessee, M.A. Guillorn, M.L. Simpson, Oak Ridge National Laboratory and University of Tennessee, C.L. Britton, G. Eres, Oak Ridge National Laboratory |
| 11:00am | NT-TuM9 Field Emission Properties of Nanostructures Based on Molybdenum Ternary Compounds V. Nemanic, M. Zumer, B. Zajec, Institute of Surface Engineering and Optoelectronics, Slovenia, M. Remskar, A. Mrzel, D. Mihailovic, Jozef Stefan Institute, Slovenia |