AVS 49th International Symposium
    Organic Films and Devices Wednesday Sessions
       Session OF+EL+SC-WeA

Paper OF+EL+SC-WeA10
Measurement of the Site Specific PDOS of Organic Electronic Materials via Soft X-ray Emission Spectroscopy@footnote 1@

Wednesday, November 6, 2002, 5:00 pm, Room C-102

Session: Molecular and Organic Films and Devices
Presenter: J.E. Downes, Boston University
Authors: J.E. Downes, Boston University
C. McGuinness, Boston University
P. Sheridan, Boston University
K.E. Smith, Boston University
J.A. Schlueter, Argonne National Laboratory
U. Geiser, Argonne National Laboratory
G. Gard, Portland State University
Correspondent: Click to Email
Recent advances in the technique of soft x-ray emission spectroscopy (XES) have produced a method to directly measure the bulk elementally and, in certain cases chemically, specific partial density of states of materials. While the detailed measurement of the valence band electronic structure of solids has traditionally been the realm of photoemission spectroscopies several problems have been encountered with the application of these techniques to organic materials. The principal issue is photon induced damage to the compound that modifies the electronic structure as it is being measured. Another is the fact that photoemission measurements probe the surface electronic structure of a material, which may or may not be representative of the bulk. We will show that the use of XES can avoid both of these problems and allows the detailed valence band electronic structure of recently developed organic electronic compounds to be measured. An overview of the technique of XES and its advantages for studying these organic compounds will be followed by specific results from several organic electronic compounds of current interest in the fields of molecular organic semiconductors, (TDATA, Alq@sub 3@, TPD, Cu-Pc etc.), and ET based conducting organic charge transfer salts, (@beta@-(ET)@sub 2@SF@sub 5@CH@sub 2@CF@sub 2@SO@sub 3@). @FootnoteText@ @footnote 1@Work supported in part by the DOE under DEFG0298ER45680; the SXE spectrometer was funded by the U.S. ARO under DAAH04950014. The experiments were performed at the NSLS which is supported by the U.S. DOE, Divisions of Materials and Chemical Sciences.