AVS 49th International Symposium
    Nanometer Structures Wednesday Sessions
       Session NS-WeP

Paper NS-WeP7
Frequency Dependence of Local Electronic Properties: Nanoimpedance Spectroscopy

Wednesday, November 6, 2002, 11:00 am, Room Exhibit Hall B2

Session: Nanometer Structures B
Presenter: R. Shao, University of Pennsylvania
Authors: S.V. Kalinin, University of Pennsylvania
R. Shao, University of Pennsylvania
D.A. Bonnell, University of Pennsylvania
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Progress in nanoelectronics necessitates an understanding of the structure and properties of materials on the local level. While substantial advances have been made in local property measurement particularly based on scanning probes, they have accessed either dc properties or ac properties at a single frequency. The ability to probe the frequency dependence of local electronic properties would lead directly to mechanistic considerations of trap states at defects, scattering at interfaces, etc., in nano or molecular electronics. We have developed a local spectroscopy that determines tip-surface impedance directly over a wide frequency range (40 Hz - 110 MHz) with nanometer spatial resolution. This approach is generalized to spatially resolved nanoimpedance spectroscopy and imaging. The technique will be illustrated on 2-D structures, an atomically abrupt interface and a nano wire; and a 3-D structure, a nano particle on a substrate.