AVS 49th International Symposium
    Magnetic Interfaces and Nanostructures Tuesday Sessions
       Session MI-TuP

Paper MI-TuP6
Current Induced Magnetoresistance in Co/Cu/Cu Multilayers

Tuesday, November 5, 2002, 5:30 pm, Room Exhibit Hall B2

Session: Aspects of Magnetism
Presenter: J.-D. Suh, Electronics and Telecommunications Research Institute, Rep. of Korea
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We have investigated the magnetic properties fabricated by e-beam lithography from a Co/Cu/Co multilayer. Current induced magnetoresistance properties for current flowing perpendicularly through the layers with a high current density of 10@super 8@A/cm@super 2@ are systematically studied as a function of device size, magnetic layer thickness and temperature. A current induced magnetic switching is observed in multilayer structures with diameters as small as 100 nm. The results are explained by spin transfer model. In this study, we shall discuss the relation between nanostructured geometry of magnetic Co/Cu/Co multilayer and current induced magnetic switching in detail.