AVS 49th International Symposium
    Applied Surface Science Tuesday Sessions
       Session AS-TuM

Paper AS-TuM3
Surface Analysis of Poly (dimethylsiloxane) using Time-of-Flight Secondary Ion Mass Spectrometry

Tuesday, November 5, 2002, 9:00 am, Room C-106

Session: Polymer Characterization
Presenter: R. Rey-Santos, The State University of New York at Buffalo
Authors: J.A. Gardella, The State University of New York at Buffalo
R. Rey-Santos, The State University of New York at Buffalo
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The study of polymer surface structures has become an important topic in surface chemistry. Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is one of the most powerful techniques for surface analysis. ToF-SIMS has been used to study the secondary and tertiary structures of polymers. The Langmuir-Blodgett technique has been used to prepare thin films of poly (dimethylsiloxane) (PDMS) monolayers. Reflection Absorption Fourier Transform Infrared Spectrophotometry (RA-FT-IR) has been used to identify the surface structure of PDMS films. The use of the statistical chain breaking model of poly (alkyl methacrylates) by Zimmerman, Hercules, and Benninghoven published in Analytical Chemistry in 1993, helped us to determine the statistical chain breaking model for PDMS. Our goal is to use polymers as model systems to investigate the ion formation mechanisms and provide information about the long-range forces between polymer chains.