AVS 49th International Symposium
    Applied Surface Science Tuesday Sessions
       Session AS-TuM

Paper AS-TuM2
TOF-HREELS and AFM Characterization of Highly Oriented Teflon (PTFE) Films

Tuesday, November 5, 2002, 8:40 am, Room C-106

Session: Polymer Characterization
Presenter: Z. Yang, University of Maine
Authors: Z. Yang, University of Maine
G. Bernhardt, University of Maine
R.L. Jackson, University of Maine
L.J. LeGore, University of Maine
P. Kleban, University of Maine
W.N. Unertl, University of Maine
B.G. Frederick, University of Maine
Correspondent: Click to Email
Highly oriented polytetrafluoroethylene (PTFE) films are potentially useful as substrates for anisotropic growth of organic and bio-materials and as model surfaces for studying surface modification. High resolution electron energy loss spectroscopy (HREELS) has advantages of surface specificity, sensitivity and the possibility of non-dipolar interaction mechanisms, but has required relatively long data acquisition times. We have developed a novel time-of-flight (TOF-HREELS) spectrometer, which utilizes a throughput advantage to dramatically reduce acquisition times.@footnote 1@ PTFE films were deposited onto sputtered films of gold and platinum on oxide-covered Si wafers by the friction transfer process.@footnote 2@ The samples were studied by AFM to characterize the film roughness and thickness. The AFM images reveal long, straight ribbons of PTFE parallel to each other when deposited at a substrate temperature of 220 °C and a pressure of 1kg/8 mm@super 2@. Comparisons are made between HREELS spectra obtained by the conventional instrument and the TOF-HREELS spectrometer. @FootnoteText@ @footnote 1@ R. H. Jackson, et al., Surf. Sci. (2002), in press; L. J. LeGore, et al., ibid.@footnote 2@ P. Bodö, M. Schott, Thin Solid Films 286 (1996) 98.