AVS 49th International Symposium
    Applied Surface Science Friday Sessions
       Session AS+MM+BI-FrM

Paper AS+MM+BI-FrM4
TOF-SIMS Analysis to Monitor Coating Processes in Organic and Biological Surfaces

Friday, November 8, 2002, 9:20 am, Room C-106

Session: BioMEMS and Medical Devices
Presenter: R. Chatterjee, 3M
Authors: R. Chatterjee, 3M
B. Lakshmi, 3M
M.J. Pellerite, 3M
Correspondent: Click to Email
Time of Flight Secondary Ion Mass Spectrometry (TOF-SIMS) has proved to be very useful in molecular surface characterization of organic coatings, polymeric systems and biological surfaces. This paper will focus on the application of TOF-SIMS in identifying reaction processes involved in formation of bio-reactive surfaces and organic coatings. In SIMS, absolute quantitative analysis becomes difficult because the ion yield is highly dependent on the morphology and the physical and chemical nature of the surface. Different examples will be used to illustrate how with the use of suitable control experiments, relative quantitative analysis can provide direction in the development of surface modification and surface coating processes. Relative quantitation of TOF-SIMS data was applied to monitor the reaction of aminoacids to different bioreactive surfaces. TOF-SIMS was used to identify presence of different proteins in a multistep sandwich assay. In thin organic coatings, the degree of cure of the silane end group was correlated to the coating durability. Relative quantitation was applied to determine the degree of cure, specify process conditions needed for suitable curing, identify a suitable catalyst to reduce curing times and determine whether lack of cure is the cause of failure. The rate of cure of mono-, bis- and trifunctional silanes, and their effect on the coating durability was investigated.