| IUVSTA 15th International Vacuum Congress (IVC-15), AVS 48th International Symposium (AVS-48), 11th International Conference on Solid Surfaces (ICSS-11) | |
| Applied Surface Analysis | Wednesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:20am | AS-WeM1 Invited Paper Surface Characterization of Biomaterials for Medical Applications H.J. Mathieu, Swiss Federal Institute of Technology Lausanne (EPFL), Switzerland |
| 9:00am | AS-WeM3 Micromechanical Properties of 'Smart' Gels: A Study of PNIPAAm by Scanning Force and Scanning Electron Microscopy T.R. Matzelle, Universite Libre de Bruxelles, Belgium, R. Reichelt, University of Muenster, Germany, N. Kruse, Universite Libre de Bruxelles, Belgium |
| 9:40am | AS-WeM5 Invited Paper Tailored Polymer Surfaces Controlled by XPS J.-J. Pireaux, Facultés Universitaires Notre-Dame de la Paix, Belgium |
| 10:20am | AS-WeM7 Synthesis and Characterization of Poly(imidesiloxane) Copolymers Containing Two Siloxane Segment Lengths: Surface Composition and Its Role in Adhesion C.M. Mahoney, State University of New York at Buffalo, J.C. Rosenfeld, Occidental Chemical Corporation, J.A. Gardella, Jr., State University of New York at Buffalo |
| 10:40am | AS-WeM8 Phase Contrast AFM Analysis of Polymers: Use of Correlative Classification Methods for Phase Identification J. Farrar, K. Artyushkova, J.E. Fulghum, Kent State University |
| 11:00am | AS-WeM9 A Surface Chemistry Study of Laser Ablated Polymers Used for Microfluidic Devices D.L. Pugmire, E.A. Waddell, C.J. Taylor, L.E. Locascio, M.J. Tarlov, National Institute of Standards and Technology |
| 11:20am | AS-WeM10 RBS-based Characterization of Hyper-Thin Silicon Compound Deposits on Polymers G. Dennler, Ecole Polytechnique de Montreal, Canada, A. Houdayer, University of Montreal, Canada, Y. Ségui, Université Paul Sabatier, France, M.R. Wertheimer, Ecole Polytechnique of Montreal, Canada |