| IUVSTA 15th International Vacuum Congress (IVC-15), AVS 48th International Symposium (AVS-48), 11th International Conference on Solid Surfaces (ICSS-11) | |
| Applied Surface Analysis | Wednesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:00pm | AS-WeA1 Invited Paper Multi-Technique Analysis of the Paint/Sealant Interface in Aircraft Structures S.J. Harris, British Aerospace, UK |
| 2:40pm | AS-WeA3 Fourier Modulus Brings Charging Samples, Auger Depth Profiles, Linear Least Squares and Factor Analysis Together D.J. Pocker, M.A. Parker, IBM Storage Technology Division, R.E. Davis, IBM Microelectronics Division |
| 3:00pm | AS-WeA4 Determination of the Depth Scale in Sputter Depth Profiling S. Hofmann, Max-Planck-Institute for Metals Research, Germany |
| 3:40pm | AS-WeA6 ARXPS Analysis of Nitrogen Distribution and Chemistry in Nitrided Gate Oxides A.C. Ferryman, J.E. Fulghum, Kent State University |
| 4:00pm | AS-WeA7 Characterizing Nanometer Oxy-nitride Films with ESCA Low Energy Sputter Depth Profiles J.H. Gibson, Physical Electronics, E.L. Principe, Applied Materials, J.F. Moulder, D.G. Watson, Physical Electronics, A. Hegedus, Applied Materials |
| 4:40pm | AS-WeA9 Reconstruction of Buried Polymer Interfaces Observed by Sum-Frequency Generation L.J. Richter, P.T. Wilson, K.A. Briggman, J.C. Stephenson, W.E. Wallace, National Institute of Standards and Technology |