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    Vacuum Science & Technology Monday Sessions
       Session VST-MoP

Paper VST-MoP6
Total and Partial Pressure Measuring Devices Not to Be Influenced By Charged Particles from External Environments

Monday, October 29, 2001, 5:30 pm, Room 134/135

Session: Developments in Vacuum Technology Poster Session
Presenter: H. Saeki, Japan Synchrotron Radiation Research Institute
Authors: H. Saeki, Japan Synchrotron Radiation Research Institute
T. Aoki, Japan Synchrotron Radiation Research Institute
K. Tatenuma, Kaken Co. Ltd., Japan
T. Momose, Miyagi National College of Technology, Japan
Correspondent: Click to Email
Some B-A gauges in the SPring-8 storage ring have indicated minus pressures or lower pressures due to influx of photoelectrons produced by synchrotron radiation.@footnote 1,2@ Partial pressures using quadrupole mass spectrometers in the ring have not been measured at stored electron beam current of more than 40 mA. It was found that electrons of more than 1 x 10@super -9@ A at the stored beam current of 70 mA flowed into the head of a quadrupole mass spectrometer. It was also found that B-A gauges using in the ring indicated minus pressures due to influx of electrons of more than 2 x 10@super -10@ A. An automatically removal device of charged particles into pressure measuring devices was designed, composed of electrostatic electrodes and an instrument of charged particles. A self-compensating circuit for a mineral insulated gauge cable@footnote 3@ used in a radiation environment was also designed. Using the automatically removal device and the self-compensating circuit, the practical vacuum gauge system with a self-compensator @footnote 2@ and the quadrupole mass spectrometer will be tested in such a hot vacuum environment and in a radiation environment around accelerators. @FootnoteText@ @footnote 1@H. Saeki and T. Momose, J. Vac. Sci. Technol. A, 18, 244 (2000). @footnote 2@H. Saeki, T. Aoki, H. Yonehara, and T. Momose, J. Vac. Sci. Technol. A, 19, 349 (2001). @footnote 3@H. Saeki, T. Aoki, and T. Momose, to be published in J. Vac. Sci. Technol. A, May/Jun (2001).