IUVSTA 15th International Vacuum Congress (IVC-15), AVS 48th International Symposium (AVS-48), 11th International Conference on Solid Surfaces (ICSS-11)
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       Session SS1-FrM

Paper SS1-FrM10
Application of EELFS Spectroscopy to Local Atomic Structure Study

Friday, November 2, 2001, 11:20 am, Room 120

Session: Dynamics of Metal Surfaces
Presenter: Yu.V. Ruts, Physical-Technical Institute of Ural Branch of RAS, Russia
Authors: Yu.V. Ruts, Physical-Technical Institute of Ural Branch of RAS, Russia
A.N. Maratkanova, Physical-Technical Institute of Ural Branch of RAS, Russia
D.V. Surnin, Physical-Technical Institute of Ural Branch of RAS, Russia
D.E. Guy, Physical-Technical Institute of Ural Branch of RAS, Russia
Correspondent: Click to Email
Fine structures above ionisation edges studied in the EELFS (Extended Energy Loss Fine Structure) technique are similar to those measured in X-ray absorption spectra (EXAFS). A possibility to measure extended structures using both transmission and reflection modes allows to obtain not only bulk parameters of the local atomic structure (partial interatomic distances, coordination numbers, backscattering amplitudes, phase shifts, etc.) but also the surface ones. Surface sensitivity makes the EELFS technique competitive with diffraction techniques especially for studying systems without long-range order. Moreover the EELFS spectroscopy is available in most surface and material physics laboratories having standard equipment with the electron exitation. In contrast to EXAFS the EELFS technique makes possible to study local domains, for example individual blocks or grains, owing to using an electron beam as an exciting source. The essential peculiarity of this method is its high sensitivity to light elements. This is very important for studying surface and bulk oxides, carbides and so on as well as the processes of their formation including gas adsorption. EELFS technique has been proved to be a powerful tool for local structural investigations of clean surfaces and chemisorbed species. Numerous papers have been published to demonstrate the applicability of the EELFS technique in the determination of the structure of different compounds and different metals deposited on clean surfaces. Application of the EELFS technique provides great progress to materials science in regards to atomic structure study. In this paper we give some examples of studying different materials by the EELFS both in transmission and reflection mode using the results obtained by different authors including our own ones. This work was sponsored in part by the Russian Foundation for Basic Research (grants 00-03-33049a and 00-15-97419).