IUVSTA 15th International Vacuum Congress (IVC-15), AVS 48th International Symposium (AVS-48), 11th International Conference on Solid Surfaces (ICSS-11)
    Surface Engineering Tuesday Sessions
       Session SE-TuA

Invited Paper SE-TuA4
Thin Film Growth by Physical Vapor Deposition in the Presence of Residual Gas

Tuesday, October 30, 2001, 3:00 pm, Room 132

Session: Hard and Superhard Coatings
Presenter: J.M. Schneider, Linkoping University, Sweden
Correspondent: Click to Email

Vacuum based techniques are characterized by the presence of residual gas. Depending on the affinity of the residual gas to the growing film material, chemical reactions may be possible. Residual gas based impurity incorporation during thin film growth has been reported previously.@footnote 1,@@footnote 2@ Here, the state of the art in residual gas - growing film interactions is reviewed. Sources for residual gas incorporation as well as incorporation mechanisms are described. Furthermore the effect of impurity incorporation on the film structure and film properties are discussed. @FootnoteText@ @footnote 1@ J.M.Schneider et al, Appl.Phys.Lett. 74, 200 (1999). @footnote 2@ J.M.Schneider et al, Appl.Phys.Lett. 75, 3476 (1999).