IUVSTA 15th International Vacuum Congress (IVC-15), AVS 48th International Symposium (AVS-48), 11th International Conference on Solid Surfaces (ICSS-11)
    Organic Films and Devices Thursday Sessions
       Session OF+TF-ThM

Paper OF+TF-ThM3
An STM , XPS and RAIRS Study of Cobalt(II) Hexadecafluorophthalocyanine (CoF16Pc) and Its Co-adsorption with Nickel(II) Tetraphenylporphyrin (NiTPP)on Au (111)

Thursday, November 1, 2001, 9:00 am, Room 131

Session: Characterization of Organic Thin Films
Presenter: S.L Scudiero, Washington State University
Authors: S.L Scudiero, Washington State University
D.E. Barlow, Washington State University
K.W. Hipps, Washington State University
Correspondent: Click to Email
Scanning tunneling microscopy (STM) images show that cobalt(II) hexadecafluorophthalocyanine (CoF16Pc) forms disordered structures when deposited on Au(111) under UHV conditions at 300K, while nickel(II) tetraphenylporphyrin (NiTPP) forms a tightly packed well organized structure under the same conditions. X-ray photoelectron (XPS) and reflection-absorption infrared spectroscopy (RAIRS) data obtained on thin films of the pure compounds confirm that the chemical composition of these films is the same as the starting bulk materials. When CoF16Pc and NiTPP are co-deposited with a monolayer coverage, the resulting surface structure is a well ordered 2D array having a 1:1 ratio and a nearly square unit cell as revealed by high resolution STM images. The composition of the mixture was confirmed by XPS. We believe that this new structure is due to the weak electrostatic interactions associated with the local partial charges and their images, along with differences in Van der Waals forces.