IUVSTA 15th International Vacuum Congress (IVC-15), AVS 48th International Symposium (AVS-48), 11th International Conference on Solid Surfaces (ICSS-11)
    Nanotubes: Science and Applications Topical Conference Thursday Sessions
       Session NT+EL+NS-ThM

Paper NT+EL+NS-ThM9
Atomic Resolution Imaging of WS2 Nanotubes

Thursday, November 1, 2001, 11:00 am, Room 133

Session: Nanotubes: Growth, Functionalization, and Sensors
Presenter: S.R. Cohen, Weizmann Institute of Science, Israel
Authors: L. Scheffer, Weizmann Institute of Science, Israel
S.R. Cohen, Weizmann Institute of Science, Israel
R. Rosentsveig, Weizmann Institute of Science, Israel
R. Popovitz-Biro, Weizmann Institute of Science, Israel
R. Tenne, Weizmann Institute of Science, Israel
Correspondent: Click to Email
Recent improvements in synthetic yields of inorganic nanotubes of metal dichalcogenides have enhanced the possibility of their technological applications.@footnote 1@ The unique optical and wear characteristics of these nanotubes make them ideal candidates for electromechanical systems.@footnote 2@ Correlation of the structural and electro-optical properties is a first step in this direction. Theory predicts delicate interplay between size, structure, and electrical properties of these nanotubes.@footnote 3@ Until now, correlation of the nanotube chirality with electrical properties has been indirect and scarce. In this work we present high resolution transmission electron microscopy (TEM) and atomic-resolution scanning tunneling microscopy (STM) images of nanotubes of WS@sub 2@. By relating the atomic registery to the tube-axis direction, the chirality of the tubes is determined. Current-voltage (I/V) spectroscopy in the STM was then applied to individual nanotubes to examine correlation between bandgap, density of states, and the nanotube chirality and size. @FootnoteText@ @footnote 1@ A. Rothschild, G.L. Frey, M. Homyonfer, R. Tenne, M. Rappaport, Mat. Res. Innovat. 3, 145 (1999). @footnote 2@ L. Rapoport, Y. Feldman, M. Homyonfer, H. Cohen, J. Sloan, J.L. Hutchison, and R. Tenne, Wear 229, 975 (1999). @footnote 3@G Siefert, H. Terrones, M. Terrones, G. Jungnickel, T. Frauenheim, Phys. Rev. Lett. 85, 146 (2000).