IUVSTA 15th International Vacuum Congress (IVC-15), AVS 48th International Symposium (AVS-48), 11th International Conference on Solid Surfaces (ICSS-11)
    Nanotubes: Science and Applications Topical Conference Friday Sessions
       Session NT+EL+NS-FrM

Paper NT+EL+NS-FrM8
Field Emission Energy Distribution for an Undergate Type Triode CNT-FED

Friday, November 2, 2001, 10:40 am, Room 133

Session: Nanotubes: Field Emission
Presenter: S. Yu, Samsung Advanced Institute of Technology, Korea
Authors: S.H. Jin, Samsung Advanced Institute of Technology, Korea
S. Yu, Samsung Advanced Institute of Technology, Korea
J.H. Kang, Samsung Advanced Institute of Technology, Korea
W. Yi, Samsung Advanced Institute of Technology, Korea
T.W. Jeong, Samsung Advanced Institute of Technology, Korea
Y.S. Choi, Samsung Advanced Institute of Technology, Korea
J.H. Lee, Samsung Advanced Institute of Technology, Korea
J.N. Heo, Samsung Advanced Institute of Technology, Korea
W.S. Kim, Sungkyunkwan University, Korea
Y.H. Lee, Sungkyunkwan University, Korea
J.M. Kim, Samsung Advanced Institute of Technology, Korea
Correspondent: Click to Email
We have measured I-V characteristics and field emission energy distribution (FEED) for an undergate-type triode carbon nanotube (CNT) field emission display (FED), which has gate electrodes located under the cathode electrodes. The emitters of an undergated CNT-FED were fabricated by the printing method on the glass plate with single walled CNT paste, which was mostly consisted of CNTs and glass powders. For the diode emission, the FEED peaks shifted from the Fermi level with the ratio of 67 meV/V by the change of the applied voltage, and the field enhancement factor was found to be 26,000 cm@super-1@ from the I-V measurement. On the while, the peaks for the triode emission shift with 270 ~ 500 meV/V, and it is expected mainly due to the strong electric field induced by the gate electrodes. Several subpeaks were also observed below the main FEED peaks, which indicated existence of other minor electron transition mechanism within CNTs. The full width at half maximum of FEED peaks for the diode and triode emissions were broader than those reported by others, i.e., 0.7 ~ 1.9 eV, which may be caused by field emission from various geometry of CNTs. In summary, we have measured the FEED of the undergate type triode CNT-FED for the first time, and the FEED peaks are shifted as the applied voltage increased, which may be ascribed to the energy band bending of dielectric materials on CNTs.