IUVSTA 15th International Vacuum Congress (IVC-15), AVS 48th International Symposium (AVS-48), 11th International Conference on Solid Surfaces (ICSS-11)
    Nanotubes: Science and Applications Topical Conference Friday Sessions
       Session NT+EL+NS-FrM

Paper NT+EL+NS-FrM11
Huge Secondary Electron Emission from Coated Carbon Nanotubes

Friday, November 2, 2001, 11:40 am, Room 133

Session: Nanotubes: Field Emission
Presenter: J.N. Heo, Samsung Advanced Institute of Technology, Korea
Authors: J.N. Heo, Samsung Advanced Institute of Technology, Korea
W.S. Kim, Sungkyunkwan University, Korea
T.W. Jeong, Samsung Advanced Institute of Technology, Korea
Y.M. Shin, Sungkyunkwan University, Korea
H.J. Jeong, Sungkyunkwan University, Korea
S. Yu, Samsung Advanced Institute of Technology, Korea
J.H. Lee, Samsung Advanced Institute of Technology, Korea
W. Yi, Samsung Advanced Institute of Technology, Korea
Y.H. Lee, Sungkyunkwan University, Korea
J.M. Kim, Samsung Advanced Institute of Technology, Korea
Correspondent: Click to Email
Carbon nanotubes (CNTs) have been reported to show very attractive properties such as high geometric anisotropy, high mechanical strength, and chemical stability, which leads to potential applications in the areas of display, nanoelectronics, and nano-sensors. According to the recent report by W.Yi and et al.(J. Appl. Phy. 89, 4091(2001)), huge secondary electron emission (SEE), i.e., value higher than 10@super 4@, was obtained for the MgO coated CNTs. In order to understand this high SEE feature systematically, a seres of samples have been fabricated by varying several parameters such as the thickness of the MgO layer, openness of the CNT tip, selectively growing of CNTs on patterned catalytic layer. CNTs were grown vertically by a thermal chemical vapor evaporator on the Si substrates with Ni and TiN thin layer. MgO or other dielectric layers were deposited on CNTs by an electron beam evaporator. Among the sample grown parameters, especially MgO thickness variation resulted in significant SEE yield change. From the thickness variation of coated CNTs from 60 to 450 nm, the maximum SEE yield was obtained for 150nm. From the energy distribution of secondary electrons, this huge SEE yield for a coated CNT is illustrated with the help of field enhanced SEE due to high geometrical aspect ratio. In addition, experimental results for different dielectric layers such as SiO@sub 2@ or LaF@sub 3@ will also be presented.