AVS 47th International Symposium | |
Surface Engineering | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
2:00pm | SE-TuA1 Invited Paper Surface Engineering by Plasma Immersion Ion Processing M.A. Nastasi, Los Alamos National Laboratory |
2:40pm | SE-TuA3 The Surface Modification of Wear Resistant HSS Cutting Tools with Adapting Engineered Coatings G.S. Fox-Rabinovich, McMaster University, Canada, A.I. Kovalev, SPRG, Russia |
3:00pm | SE-TuA4 Enhanced Passivity of Austenitic AISI 304 Stainless Steel by Low-Temperature Ion Nitriding S. Rudenja, Tallinn Technical University, Estonia, I. Odnevall Wallinder, C. Leygraf, Royal Institute of Technology, Sweden, P. Kulu, V. Mikli, Tallinn Technical University, Estonia |
3:20pm | SE-TuA5 CVD Diamond Nucleation under Extreme Conditions K.-A. Feng, Institute of Physics, CAS, China, J. Kang, University of Michigan, Z. Lin, Institute of Physics, CAS, China |
3:40pm | SE-TuA6 Large-area Nitrogen-doped SiO@sub 2@ Films Deposition in a Large-scale Integrated RF PSII/PVD System L. Wu, D. Manos, College of William and Mary |
4:00pm | SE-TuA7 Cleaning, Etching and Oxidation of W films for Microelectronics Applications P. Cao, M.-S. Lim, S.S. Perry, University of Houston, E.J. Mitchell, D.C. Koeck, H.C. Galloway, Southwest Texas State University |
4:20pm | SE-TuA8 Reactions of Fluorocarbon Polyatomic Ions with Polymer Surfaces M.B.J. Wijesundara, L. Hanley, University of Illinois at Chicago |
4:40pm | SE-TuA9 An Aging Study of Fluorocarbon Plasma Polymers Deposited on Si-C Plasma Polymer Films Using XPS C.E. Moffitt, D.M. Wieliczka, University of Missouri, Kansas City, Q.S. Yu, C.M. Reddy, H.K. Yasuda, University of Missouri, Columbia |
5:00pm | SE-TuA10 An XPS Investigation into the Role of Oxygen in the Structural Formation of Methylated Silane Plasma Polymers C.E. Moffitt, D.M. Wieliczka, University of Missouri, Kansas City, T.M. El-Agez, Islamic University of Gaza, Palestine, Q.S. Yu, C.M. Reddy, H.K. Yasuda, University of Missouri, Columbia |