| AVS 47th International Symposium | |
| Processing at the Nanoscale/NANO 6 | Friday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:20am | NS+NANO6+MC-FrM1 Invited Paper Identification of Atom Species on Semiconductor Surface Using Noncontact AFM Y. Sugawara, Osaka University, Japan |
| 9:00am | NS+NANO6+MC-FrM3 Dynamic Polarization Imaging using Heterodyned Electrostatic Forces D.R. Oliver, A. Pu, D.J. Thomson, G.E. Bridges, University of Manitoba, Canada |
| 9:20am | NS+NANO6+MC-FrM4 Atomic Scale Chemical Identification on Si(111)@sr@3x@sr@3-Ag by Atom Probe-Scanning Tunneling Microscope T. Shimizu, H. Tokumoto, JRCAT-NAIR, Japan |
| 9:40am | NS+NANO6+MC-FrM5 Tunneling Spectroscopy of Passivated Gold Nanocrystals R.B. Wyrwas, A.Y. Ogbazghi, T.P. Bigioni, L.E. Harrell, Georgia Institute of Technology, T.G. Schaaff, Oak Ridge National Laboratory, R.L. Whetten, P.N. First, Georgia Institute of Technology |
| 10:00am | NS+NANO6+MC-FrM6 Scanning Probe Microscopy Study of Engineered Ferroelectric Domain Structures G. Rosenman, A. Agronin, Y. Rosenwaks, M. Lesnih, P. Urenski, Tel-Aviv University, Israel |
| 10:20am | NS+NANO6+MC-FrM7 Imaging of Single Molecules by Low Energy Electron Point Source Microscopy A. Eisele, B. Völkel, Universität Heidelberg, Germany, S. Rehbein, Universität Göttingen, Germany, B. Jäger, Universität Heidelberg, Germany, H.J. Kreuzer, Dalhousie University, Canada, A. Gölzhäuser, M. Grunze, Universität Heidelberg, Germany |
| 10:40am | NS+NANO6+MC-FrM8 Atomically-resolved Observation of Single Surface States and Trapped Electrons at Semiconductor Surfaces using Photovoltage Imaging with STM S. Aloni, I. Nevo, G. Haase, Weizmann Institute, Israel |