| AVS 47th International Symposium | |
| Surface Science | Friday Sessions |
| Session SS+MC-FrM |
| Session: | Characterization of Oxides and Thin Films |
| Presenter: | Y. Aiura, Electrotechnical Laboratory, Japan |
| Authors: | Y. Aiura, Electrotechnical Laboratory, Japan H. Bando, Electrotechnical Laboratory, Japan I. Hase, Electrotechnical Laboratory, Japan T. Yasue, Tsukuba University, Japan T. Saitoh, University of Colorado D.A. Dessau, University of Colorado |
| Correspondent: | Click to Email |