| AVS 47th International Symposium | |
| Surface Science | Friday Sessions |
| Session SS+MC-FrM |
| Session: | Characterization of Oxides and Thin Films |
| Presenter: | C. Werdinius, Chalmers University of Technology, Sweden |
| Authors: | C. Werdinius, Chalmers University of Technology, Sweden O. Hjortsberg, Volvo Technological Development Corporation, Sweden L. Österlund, Chalmers University of Technology, Sweden B. Kasemo, Chalmers University of Technology, Sweden |
| Correspondent: | Click to Email |