AVS 47th International Symposium
    Magnetic Interfaces and Nanostructures Monday Sessions
       Session MI-MoM

Paper MI-MoM7
Diffuse X-Ray Resonant Magnetic Scattering (DXRMS) of Thin Magnetic Films on Anisotropic Substrates

Monday, October 2, 2000, 10:20 am, Room 206

Session: Magnetic Spectroscopies
Presenter: J.J. Kelly IV, University of Wisconsin, Madison
Authors: J.J. Kelly IV, University of Wisconsin, Madison
D.E. Savage, University of Wisconsin, Madison
F. Liu, University of Wisconsin, Madison
F. Flack, University of Wisconsin, Madison
M.G. Lagally, University of Wisconsin, Madison
Correspondent: Click to Email
Recent applications of very thin magnetic films and magnetic multilayers, such as in magneto-electronics or magnetic data storage, have emphasized the necessity of understanding the nature of magnetism at surfaces and interfaces. For example, the effect of surface and interface morphology, both chemical and magnetic, on spin dependent electron scattering, and thus spintronics devices, is a critical question. Diffuse x-ray resonant magnetic scattering (DXRMS), a unique element-specific technique, provides information on both the chemical and magnetic morphology at surfaces and interfaces by looking at the diffuse and specular components of resonant magnetic x-ray scattering. Using DXRMS and the magneto-optical Kerr effect (MOKE), we have investigated the influence of deliberately induced anisotropic morphology on the magnetic properties of thin magnetic films and multilayers. Changes in x-ray scattering and coercivity are observed as the sample is rotated relative to the incident x-ray beam, and correlated with morphology. The results are discussed in light of previous results using DXRMS and theory. @FootnoteText@ Research supported by NSF and Seagate.