AVS 47th International Symposium
    Magnetic Interfaces and Nanostructures Monday Sessions
       Session MI-MoM

Invited Paper MI-MoM5
X-Ray and Neutron Scattering Studies of Magnetic Roughness in Thin Magnetic Films

Monday, October 2, 2000, 9:40 am, Room 206

Session: Magnetic Spectroscopies
Presenter: S.K. Sinha, Argonne National Laboratory
Authors: S.K. Sinha, Argonne National Laboratory
S.A. Stepanov, Illinois Institute of Technology & Argonne National Laboratory
R.M. Osgood, Argonne National Laboratory
Correspondent: Click to Email
It has become apparent that magnetic roughness at interfaces plays an important role in, for instance, the magnetic and transport behavior of thin film magnetic devices. Reflectivity and diffuse scattering studies of thin films using neutrons or X-rays can be used to distinguish between chemical and magnetic roughness at interfaces and to determine the parameters characterizing the latter, such as the correlation length. We discuss the theory of magnetic scattering of neutrons and resonant X-rays by rough interfaces within the Born and Distorted Wave Born Approximations and illustrate how it has been used to analyze experimental results attained on several systems so far.