| AVS 46th International Symposium | |
| Thin Films Division | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:00pm | TF-ThA1 Invited Paper Working Smarter with Microanalytical Tools M.J. Edgell, Charles Evans & Associates |
| 2:40pm | TF-ThA3 Near Surface Chemical Dependence of Electronic States at Al-Doped TiO@sub 2@(110)Ultrathin Films S.H. Goss, L. Brillson, Ohio State University, S.A. Chambers, Pacific Northwest National Laboratory |
| 3:00pm | TF-ThA4 Microstructure and EL Properties of the ZnS:Mn Luminescence Materials with Co-dopants Q. Zhai, K.E. Waldrip, J. Li, J.S. Lewis, K. Jones, P.H. Holloway, University of Florida, M. Puga-Lambers, M. Davidson, MICROFABRITECH |
| 3:20pm | TF-ThA5 Structural Determination of Wear Debris Generated from Sliding Wear Tests on Ceramic Coatings Using Raman Microscopy C.P. Constable, J. Yarwood, P. Hovsepian, L.A. Donohue, W.-D. Münz, Sheffield Hallam University, UK |
| 3:40pm | TF-ThA6 Effect of Rapid Thermal Annealing Temperature on the Formation of CoSi Studied by X-ray Photoelectron Spectroscopy and Micro Raman Spectroscopy J. Zhao, L. Ballast, T. Hossain, R. Trostel, B. Bridgman, Advanced Micro Devices |
| 4:00pm | TF-ThA7 Optical Metrology for Process Development and Control of Universal Anti-Reflective Layers J.M. Holden, Nanometrics, Inc., Y. Wang, Z. Karim, K. MacWilliams, Novellus Systems |
| 4:20pm | TF-ThA8 Temperature Dependence of Structure and Electrical Properties of Germanium-Antimony-Tellurium Thin Films J. González-Hernández, E. Prokhorov, Y.V. Vorobiev, Centro de Investigacion y de Estudios Avanzados del IPN, Mexico |