AVS 46th International Symposium
    Surface Science Division Wednesday Sessions
       Session SS3+EM-WeM

Paper SS3+EM-WeM11
Resonant Auger Studies of Metallic Systems

Wednesday, October 27, 1999, 11:40 am, Room 604

Session: Surface Electronic Structure
Presenter: I. Coulthard, Argonne National Laboratory
Authors: I. Coulthard, Argonne National Laboratory
J.W. Freeland, Argonne National Laboratory
S.P. Frigo, Argonne National Laboratory
J.F. Moore, Argonne National Laboratory
W.S. Calaway, Argonne National Laboratory
M.J. Pellin, Argonne National Laboratory
M. Mendelsohn, Argonne National Laboratory
T.K. Sham, University of Western Ontario, Canada
S.J. Naftel, University of Western Ontario, Canada
A. Stampfl, Australian Nuclear Science and Technology Organization
Correspondent: Click to Email
Auger electron emission at photon energies near the asoociated absorption edge which generates the initial core hole is a complex process. Excitation and decay become linked such that the process must be described as a single-step process rather than the classical two step process for Auger emission. This results in the production of discrete lines which are resonantly enhanced at the absorption edge, and whose intensity vanishes far below or above the edge. Another result of utilizing resonant photon energies is that the Auger line width may no longer be limited by the intrinsic lifetime resulting in a narrowing of the Auger spectrum.@footnote 1@ Results will be presented for a variety of systems including, Cu, Co, Al, CuNi alloys, and CuAl alloys. Specific attention will be paid to:probing unoccupied densities of states, very high resolution x-ray absorption spectroscopy utilizing auger yields to produce sub-lifetime narrowed x-ray absorption spectra, and the use of the technique for non-homogeneous sample systems. Work at Argonne is supported by the U.S. Department of Energy, Basic Energy Sciences, under Contract No. W-31-109-Eng-38. @FootnoteText@@footnote 1@T.M. Grehk, W. Drube, R. Treush, and G. Materlik. Phys. Rev. B 57, 6422 (1998).