AVS 46th International Symposium
    Surface Science Division Wednesday Sessions
       Session SS2+AS+PS-WeM

Paper SS2+AS+PS-WeM4
Matrix Dependent He+ Neutralization by Adsorbates: An ISS Study of S and Cl on TiO@sub 2@(110)

Wednesday, October 27, 1999, 9:20 am, Room 607

Session: Ion-Surface Interactions I
Presenter: W. Hebenstreit, Tulane University
Authors: W. Hebenstreit, Tulane University
E.L.D. Hebenstreit, Tulane University
U. Diebold, Tulane University
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We have studied the adsorption of S and Cl on TiO@sub 2@(110) with low-energy He@super +@ ion scattering spectroscopy (ISS) , X-ray photoelectron spectroscopy (XPS), and scanning tunneling microscopy (STM). Because of its high surface sensitivity, ISS is ideally suited to determine the chemical composition of surfaces. While it is well known that quantification of ISS spectra is influenced by trajectory-dependent blocking, the element-specific neutralization of the probing ion is generally assumed not to be matrix dependent. We found that the neutralization of He+ ions (400 - 2450 eV, scattering angle 139°) scattered on Cl or S (adsorbed on TiO@sub 2@(110)), depends strongly on sample pretreatment and adsorption site. Cl (~ 1 ML) and S (~ 2/3 ML) give rise to pronounced peaks in ISS spectra when adsorbed on the sputtered TiO2 sample (1 keV Ar@super +@, flux 1.5 10@super 16@ cm@super -2@), but both species cannot be detected after adsorption at RT on the annealed, stoichiometric TiO@sub 2@(110) surface (coverage ~ 1/3 ML). STM shows that the adsorbates are located on the rows of 5-fold coordinated Ti atoms. When dosed at 573 K, S adsorbs at the position of bridging oxygen atoms, where it forms a (1x3) superstructure. In this case S becomes "visible" again for ISS. All spectra (on sputtered and annealed substrates) show a decrease in the O and Ti ISS signal due to blocking induced by the adsorbates. Subsurface positions of the adsorbates in the "invisible cases" can be excluded by STM. The difference in neutralization is due to different electronic structures of the substrate surface: (a) semiconducting with a 3 eV band gap when annealed; (b) metallic due to defect states and oxygen deficiency after sputtering. In case of S located at the position of bridging oxygens, neutralization is affected by the different local bonding.