AVS 46th International Symposium
    Surface Science Division Wednesday Sessions
       Session SS1-WeM

Paper SS1-WeM8
High-Resolution Structural Analysis of Te/Ge(001)

Wednesday, October 27, 1999, 10:40 am, Room 606

Session: Surface Structure
Presenter: B.P. Tinkham, Northwestern University
Authors: B.P. Tinkham, Northwestern University
P.F. Lyman, University of Wisconsin, Milwaukee
O. Sakata, Northwestern University
D.A. Walko, Northwestern University
M.J. Bedzyk, Northwestern University, Argonne National Laboratory
Correspondent: Click to Email
We propose models for the surface structure of Te/Ge(001). Te has proven to be an effective surfactant for Si/Ge heteroepitaxy.@footnote 1@ Thus, the study of Te/Ge(001) will determine more precisely the method of surfactant action. Our group has performed high-resolution XSW (X-Ray Standing Wave) and LEED (Low-Energy Electron Diffraction) studies at Te coverages of 1 and .5 monolayer. We are presently investigating these structures with surface x-ray diffraction in order to allow us to fully describe the surface structure, including the composition and structure of the Te dimers. STM will also be used to verify the competing models suggested by the x-ray measurements. @FootnoteText@ @footnote 1@ H.J Hosten, J. Klatt, G. Lippert, E.Bugiel, and S. Higuchi, J. Appl. Phys. 74, 2507 (1993).